Description
High Resolution Force Modulation AFM Probe DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS High Resolution Force Modulation AFM Probe Single carbon spike on silicon apex! The SHR75 is based on BudgetSensors’ well established Multi75GB-G probe and it is suitable for high resolution light tapping mode operation. The SHR75 probe has a single hydrophobic diamond-like carbon extratip at the apex of Gold coated silicon etched probe. There are no additional smaller extratips near the main one, just one well defined extratip. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip SHAPE
Very Sharp for High Resolution Tip Height
17µm – From 15µm To 19µm Tip Setback
15µm – From 10µm To 20µm Tip Radius < 1nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
3N/m – From 1N/m To 7N/m Resonance Frequency
75kHz – From 60kHz To 90kHz Length 225µm – From 215µm To 235µm Width 28µm – From 23µm To 33µm Thickness 3µm – From 2µm To 4µm
