Description
DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs 70° pre-tilt EBSD holder for standard 1″ /25mm embedding mounts. With this mount there is no need to tilt the SEM specimen stage which avoids drift and enables quick setup for EBSD analysis. Standard 3.2mm (1/8″) pin. Material: vacuum grade aluminum with stainless steel set screws and allen key. Screws used are M3 x 6mm Soc Cap, SS and M3 x 12mm Soc Cap, SS and M3 x 3mm, Set, SS EBSD Holder for 1″/25mm Mounts, 70° Pre-Tilt, Pin
