Description
METAL PROBE, 400UM, 0.3N/M, 4.5KHZ DESCRIPTION
TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Solid Metal Probe, 0.3 N/m, 5 kHz RockyMountain Nanotechnology (RMN) probes are uniquely constructed from pureplatinum and placed on a standard AFM probe sized ceramic substrate.Solid metal probes offer excellent conductivity and suffer no thin-filmadhesion problems that occur with metal-coated silicon probes. Theseprobes also have a tip radius (< 20 nm) which is difficult toroutinely obtain by standard AFM probe processing methods. These probesare ideal for C-AFM, SCM, and KPFM/EFM applications. They are availablein a range of spring constants. Each probe tip is individually imagedby FE-SEM to verify that the metallic probe tip radius is below 20nm. Tip Geometry:
Solid Wire Tip Height:
~100 Tip Radius (Nom):
<20 Cantilever Material:
Solid Platinum Cantilever Geometry:
Rectangular Cantilevers Number:
1
