Description
High Resolution Tapping Mode AFM Probe DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS High Resolution Tapping Mode AFM Probe Single carbon spike on silicon apex! The SHR300 is based on BudgetSensors’ well established Tap300GB-G probe and it is suitable for high resolution, high frequency non-contact / tapping mode operation This model features a single sharp hydrophobic diamond-like carbon extratip at the apex of gold coated silicon etched probe. There are no additional smaller extratips near the main one, just one well defined extratip. The AFM holder chip fits most commercial AFM systems as it is industry standard size. AFM Tip SHAPE
Very Sharp for High Resolution Tip Height
17µm From 15µm To 19µm Tip Setback
15µm From 10µm To 20µm Tip Radius < 1nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
40N/m – From 20N/m To 75N/m Resonance Frequency
300kHz – From 200kHz To 400kHz Length 125µm – From 115µm To 135µm Width 30µm – From 25µm To 35µm Thickness 4µm – From 3µm To 5µm
