Description
Gold Coated Tapping Mode AFM Probe with Long Cantilever DESCRIPTION
TIP SPECIFICATIONS
CANTILEVER SPECIFICATIONS Gold Coated Tapping Mode AFM Probe with Long Cantilever Monolithic silicon AFM probe for high frequency non-contact and tapping mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with: BudgetSensors Tap190 series features a longer cantilever and it is meant as an alternative to BudgetSensors Tap300 probes series, when the feedback loop of the AFM system does not accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series. Not recommended for electric applications on abrasive sample surfaces! AFM Tip SHAPE
Rotated Tip Height
17µm – From 15µm To 19µm Tip Setback
15µm – From 10µm To 20µm Tip Radius < 25nm Half Cone Angle
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex AFM Cantilever Shape
Beam Force Constant
48N/m – From 28N/m To 75N/m Resonance Frequency
190kHz – From 160kHz To 220kHz Length 225µm – From 215µm To 235µm Width 38µm – From 33µm To 43µm Thickness 7µm – From 6µm To 8µm
