Description
DESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3.2mm (1/8″) pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z-movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain the optimized working height. See Hitachi M4 Holders if you have a Hitachi SEM, FESEM, or FIB system. These specimen holders can also be used on JEOL SEMs if a pin mount adapter to JEOL cylinder mount is used (#15362, #15362-12, #15362-15, #16153-9, or #16216-9). Used on FEI/Philips, ZEISS, LEO, Leica, Cambridge Instruments, CamScan and Tescan SEMs Wider Version Large Set Screw Vise Set screw vise with an open slot of 13.2mm (0.520″) wide x 3.9mm (0.155″) deep. Ø25mm (1″) x 17.5mm (0.69″) high. Made of machined aluminum with stainless steel set screws. Two sizes of set-screws included, M3 x 6mm and M3 x 8mm. Holder has a 9.5mm long 3.2mm (1/8″) diameter pin. Allen wrench included. Also shown on right holding a UHV-EL Reference Standard for EDS/WDS (not included).
